The course covers the basics and field practices of interferometry, super-virtual interferometry, and parsimonious interferometry for near-surface seismic applications.
Duration
8 hours
Intended Audience
Intermediate Level
Pre-requisites (Knowledge/Experience/Education Required)
Geoscientists and engineers, especially those who process seismic data, and anyone who needs to understand the basic theory and field applications of near-surface interferometry including refraction and reflection super-virtual interferometry and parsimonious interferometry.
Detailed Course Description
Near-surface interferometry is commonly used to enhance the far-offset traces with a low signal-to-noise ratio. The technique has been, successfully, used in field examples. There are two main advantages of enhancing the far-offset traces, (1) Enhance the refraction events, which will increase the accuracy of refraction picking, and (2) increase the maximum penetration depth of the final velocity model. On the other hand, parsimonious interferometry is used to decrease the number of shot gathers recorded in the field, which saves field time. It also generates virtual first break travel times to fill the missing travel times due to the skipped shot gathers. The virtual travel times’ accuracy is extremely high, and the time saved in the field is more than 80% of the original acquisition time.
This course will explain the basics of interferometry, super-refraction, and parsimonious interferometry in the case of refraction, reflection, and surface waves. Techniques are addressed using synthetic and field examples. The advantages and limitations will also be discussed. The common applications are shallow geology, engineering, and environmental applications. It is also used to generate better velocity models for static corrections.
Learner Outcomes
- Increase the signal-to-noise ratio of refraction waves at far-offset traces
- Generate virtual refraction travel times using a parsimonious interferometry technique
- Apply super-virtual and parsimonious interferometry on synthetic and field data
- Distinguish between successful and failed application of near-surface interferometry